Molecular Genetic Diversity and Line × Tester Analysis for Resistance to Late Wilt Disease and Grain Yield in Maize

Late wilt disease (LWD) caused by the fungus Magnaporthiopsis maydis poses a major threat to maize production. Developing high-yielding and resistant hybrids is vital cope with this destructive disease. The present study aimed at assessing general (GCA) specific (SCA) combining abilities for agronomic traits resistance LWD, identifying high determining parental genetic distance (GD) using SSR markers investigating its relationship hybrid performance SCA effects. Ten diverse yellow inbred lines assembled from different origins three testers were crossed line × tester mating design. obtained 30 test-crosses plus check TWC-368 evaluated in two field trials. Earliness locations. While LWD was tested under nitrogen levels (low levels) nursery that artificially infected pathogen maydis. Highly significant differences detected among lines, testers, their corresponding most measured traits. non-additive gene action had more important role than additive one controlling inheritance of earliness, grain yield, LWD. L4 L5 identified as an excellent source favorable alleles yielding Four T1, L9 T2, exhibited Parental GD ranged 0.60 0.97, average 0.81. dendrogram grouped genotypes into main clusters, which could help reducing number generated crosses will be displayed association yield suggests good predictor